MRF6P21190HR6
7
RF Device Data
Freescale Semiconductor
TYPICAL CHARACTERISTICS
Figure 12. MTTF Factor versus Junction Temperature
250
108
90
TJ, JUNCTION TEMPERATURE (°C)
This above graph displays calculated MTTF in hours when the device
is operated at VDD
=28Vdc,Pout
= 44 W Avg., and
ηD
= 26.5%.
MTTF calculator available at http://www.freescale.com/rf. Select
Software & Tools/Development Tools/Calculators to access MTTF
calculators by product.
107
106
105
110 130 150 170 190
MTTF (HOURS)
210 230
W--CDMA TEST SIGNAL
246810
0.0001
100
0
PEAK--TO--AVERAGE (dB)
Figure 13. CCDF W--CDMA 3GPP, Test Model 1,
64 DPCH, 67% Clipping, Single--Carrier Test Signal
10
1
0.1
0.01
0.001
Figure 14. 2-Carrier W-CDMA Spectrum
f, FREQUENCY (MHz)
3.84 MHz
Channel BW
-- I M 3 i n
3.84 MHz BW
+IM3 in
3.84
MHz BW
--ACPR in
3.84 MHz BW
+ACPR in
3.84 MHz BW
PROBABILITY (%)
(dB)
+20
+30
0
-- 1 0
-- 4 0
-- 5 0
-- 6 0
-- 7 0
-- 8 0
-- 2 0
-- 2 5 251510
20
5
0
-- 5
-- 1 0
-- 1 5
-- 2 0
-- 3 0
W--CDMA. ACPR Measured in 3.84 MHz Channel
Bandwidth @
±5 MHz Offset. IM3 Measured in
3.84 MHz Bandwidth @
±10 MHz Offset. PAR =
8.5 dB @ 0.01%
Probability on
CCDF
LIFETIME BU
Y
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